Advanced electron microscopy techniques applied to nanomaterials and nano-objects

22 gennaio 2019
January 22, 2019
DII - Dipartimento di Ingegneria Industriale
via Sommarive, 9 - 38123 Povo, Trento
+39 0461 282500 - 2503
fax +39 0461 281977

Venue: Seminar Room , Polo scientifico-tecnologico Fabio Ferrari, via Sommarive 9 - Trento
Time: 11:00 am


  • Ovidiu Ersen - Institut de Physique et Chimie des Matériaux de Strasbourg, University of Strasbourg, France

The optimization of the properties of the nanomaterials and nano-objects requires in-depth analysis of their structural, morphological and chemical features. In a transmission electron microscope (TEM), combining the classical imaging and spectroscopic modes with the 3D and in-situ approaches allows uncovering materials 3D characteristics, properties and dynamical behavior. A special focus is put here on three modes: in-situ TEM, quantitative tomography and operando environmental TEM. The in-situ TEM is adapted for assessing the evolution of nanostructures in real time under thermal or electrical constraints, the electron tomography gives access to quantitative analysis of their 3D structural and chemical parameters, whilst the operando TEM offers an elegant solution for solving their behavior under realistic environmental conditions. 

The aim of this talk is to illustrate through highlighting examples the recent progress in the use of TEM to fulfill the gap between the development of new nanomaterials and nanostructures, their characterization and subsequent properties. More generally, this contribution aims at providing to materials scientists a representative set of studies for illustrating the capabilities of the modern TEMs that can be transposed to their own research.

Ovidiu ERSEN is a Full Professor at the University of Strasbourg and Institute of Physics and Chemistry of Materials of Strasbourg (IPCMS) and is affiliated at present to IUF (Institut Universitaire de France). He received the award « Fondation Univ. Strasb. – Cercle Gutenberg » in 2012 and became USIAS fellow at the University of Strasbourg. His research topics consist in the development of new concepts and analysis methods in electron microscopy for solving the dynamical changes in materials at the nanometre scale and in three dimensions. By using new generation TEM cells, the implementation of in situ TEM methodologies has become one of his priorities, in particular for performing analysis in gas atmospheres and high temperatures/pressures conditions and under electrochemical conditions. 


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